Measurement of the shot noise in a single-electron transistor
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چکیده
منابع مشابه
Single-shot readout with the radio-frequency single-electron transistor in the presence of charge noise
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ژورنال
عنوان ژورنال: Physical Review B
سال: 2009
ISSN: 1098-0121,1550-235X
DOI: 10.1103/physrevb.80.155320